A research team led by Prof. WANG Huanqin at the Institute of Intelligent Machines, the Hefei Institutes of Physical Science of the Chinese Academy of Sciences, recently proposed a semi-supervised ...
A technical paper titled “SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering” was published (preprint) by researchers at imec, University of Ulsan, and KU ...
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